Specifications
B1500A Semiconductor Device Parameter Analyzer (Agilent)
Agilent B1500A Semiconductor Device Analyzer of Precision Current-Voltage Analyzer Series is an all in one analyzer supporting IV, CV, pulse/dynamic IV and more, which is designed for all-round characterization from basic to cutting-edge applications. It provides a wide range of measurement capabilities to cover the electrical characterization and evaluation of devices, materials, semiconductors, active/passive components, or virtually any other type of electronic device with uncompromised measurement reliability and efficiency. In addition, the B1500A's modular architecture with ten available slots allows you to add or upgrade measurement modules if your measurement needs change over time.
Measurement Capabilities
- Current-voltage (IV) measurement capabilities of spot, sweep, sampling and pulse measurement in the range of 0.1 fA - 1 A / 0.5 µV - 200 V
- AC capacitance measurement in multi frequency from 1 kHz to 5 MHz and Quasi-Static Capacitance-Voltage (QS-CV) measurement capabilities
- Advanced pulsed IV and ultra-fast IV measurement capability from minimum 5 ns sampling interval (200 MSa/s)
- Up to 40 V high voltage pulse forcing for non-volatile memory evaluation
Additional Features
- Configurable and upgradeable measurement modules up to 10 slots in a box
- 15-inch wide touch screen supports intuitive GUI operation of the EasyEXPERT group+
- Windows Embedded Standard 7 (WES7)
- GPIB, USB, LAN interfaces, and VGA video output port
Mainframe Features
- PC-based instrument with Microsoft Windows OS and EasyEXPERT software
- Single-box solution for current-voltage (IV), capacitance-voltage (CV), pulse generation, fast IV, and time-domain measurement.
- Ten module slots for source monitor units (SMUs) and other module types (MFCMU, HV-SPGU and WGFMU)
- Offline data analysis and application test development via Desktop EasyEXPERT software
Multiposition Wafer Four Point Probe (Jandel)
The Multiposition Wafer Probe has the ability to probe 1, 5, 9, or somewhat more positions on multiple wafers with 1mm positioning repeatability from wafer to wafer. It is not motorized, but requires that the user moves the wafer stage by hand. It is equipped with a 6″ (150mm) wafer chuck.
Multiposition Wafer Probe Specifications
- Wafer Chuck - Hard anodized aluminum alloy with vacuum hold, centering grooves, and tweezer notch for: 6″ model - 3″, 4″, 5″ and 6″ wafers.
- Preset Measurement Positions: Center and four radii at right angles 15, 20, 25, 35, 50, and 60mm