On Going Projects

1. Project 785891, "Emission Inventory Study of Ocean Cruising Vessels", Maersk Line Ltd, PI- H.P.Bao, 05/15/08 - 05/30/09, $41,000.

2. Project 0538581, "Scholarships for Future Marine Engineering Workforce Professionals, Scientists and Industry Leaders", NSF, PI: Baysal, Co-PI: H.P. Bao & A.Dean. G.Hou, B. Newman, 08/16/08- 08/16/2012, $599,000.

3. Project 391471, "Collaborative Research- Marine Career Tech Stem Careers in Shipbuilding and Marine Industry, NSF, PI: A. Verma, Co-PI: H.P.Bao, Dwivedi, McKinney, Whiteley, Lester, Dickerson, 10/01/2009 - 09/30/2012,

4. STEM Education, Sub-Area 12-DK-102, " Inter- Disciplinary Training in Undergraduate Bio-Medical Engineering", NIH, Date of Submittal: April 2009, Co-PI- H.Bao.

5. Major Research Instrumentation (MRI) Program of NSF, "Acquistion of a 3D Metal Object Printer for Innovative Manufacturing, Biomedical and Implant Applications", Date of Submittal: August 10, 2009, $ 1,384,467.

6. Virginia Transportation Board, "Highway Traffic Congestion & Integration of Short Sea Shipping into the Intermodal Supply Chain in the Mid Atlantic Region of the US East Coast", VMASC and SMRO Institute, December 2009, $ 350,000.

7. Supplementary metrics to sustain fleet readiness from a maintenance perspective.

    Key Features:

• Key Considerations: Maintenance requirements, training, configuration, logistics support, equipment conditions, effectiveness measures
• Aggregate Nature: One single aggregate metric. Distinction between critical and other factors can be traded off. Metric for use at highest decision level

    Ref: H. Bao, A. Dean, and J. J. Reina, " Identification of supplementary metrics to sustain fleet readiness from a mainteance perspective", 2008 American Society of Naval Engineers , No. 2, pp 81-88

  8.  Economic Model for the maintenance of a device submitted to minor and major  repairs.

    Key Features:

• Markov Model to optimize mean time to preventive maintenance to maximize availability
• Two types of failure:

           a) Random failure of device

           b) Deterioration failure